Appearance Inspection Device Prestige V
Cost-reduction model of Prestige II developed specifically for 8-inch wafers. It is capable of simultaneously inspecting defects and irregularities on the wafer.
PRESTIGE V is a budget version of the existing PRESTIGE II. The size of the device has been reduced by 50%, making it more space-efficient. The camera angle is set during the evaluation stage and fixed at the time of factory shipment. Although there are limitations on wafer size, it inherits the inspection capabilities of the PRESTIGE II as a budget version product.
- Company：CCTECH Japan CCTECH Japan（株）- 日本法人
- Price：Other
